Title :
Built-in self-test: assuring system integrity
Author :
Könemann, Bernd ; Bennetts, Ben ; Jarwala, Najmi ; Nadeau-Dostie, Benoit
Author_Institution :
LogicVision, San Jose, CA, USA
fDate :
11/1/1996 12:00:00 AM
Abstract :
Today´s complex electronic products are harder to test using traditional external methods. Built in self test can frequently be used without significantly increasing a product´s size, cost and production time
Keywords :
built-in self test; integrated circuit manufacture; integrated circuit testing; integrated circuits; quality control; built in self test; complex electronic products; cost; product size; production time; system integrity assurance; Automatic testing; Built-in self-test; Circuit testing; Costs; Electronic equipment testing; Life testing; Logic; Probes; Production; System testing;
