DocumentCode :
1461596
Title :
Microstructure and Magnetic Properties of In-Situ Deposited 
FePt Films on MgO(200) Films of Varying Thicknesses
Author :
Chen, S.C. ; Sun, T.H. ; Shen, C.L. ; Peng, W.C. ; Chen, C.D. ; Kuo, P.C. ; Chen, J.R.
Author_Institution :
Dept. of Mater. Eng., Ming Chi Univ. of Technol., Taipei, Taiwan
Volume :
47
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
517
Lastpage :
520
Abstract :
The FePt(30 nm)/MgO bilayer films with various MgO(200) underlayer thicknesses of 0 to 30 nm are in-situ deposited on Si substrates. A weak (111)FePt peak as well as strong (001)FePt and (002)FePt peaks are observed in XRD pattern of single-layered FePt film with no MgO underlayer. When a 5 nm thick MgO film is introduced under the FePt film, the (111)FePt peak almost disappears and both the (001)FePt and (002)FePt peaks are enhanced greatly. This indicates that the perpendicular magnetic anisotropy of FePt film can be improved by introduction of a thinner MgO underlayer. However, a weak (111)FePt peak appears again as the MgO underlayer is increased to 10 nm, revealing that the perpendicular magnetic anisotropy of FePt film will be deteriorated by introducing a thicker MgO underlayer.
Keywords :
X-ray diffraction; coercive force; ferromagnetic materials; iron alloys; magnetic thin films; perpendicular magnetic anisotropy; platinum alloys; sputter deposition; FePt-MgO-Si; MgO(200) films; Si; XRD; bilayer films; coercivity; magnetic properties; microstructure; perpendicular magnetic anisotropy; size 0 nm to 30 nm; Magnetic domains; Magnetic properties; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Substrates; FePt/MgO bilayer films; MgO underlayer; in-situ deposited; magnetic properties; perpendicular magnetic anisotropy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2011.2104355
Filename :
5721807
Link To Document :
