DocumentCode
1461700
Title
Coupling-of-modes analysis of thin film plate acoustic wave resonators utilizing the S0 Lamb mode
Author
Yantchev, Ventsislav
Author_Institution
Dept. of Solid State Electron., Uppsala Univ., Uppsala, Sweden
Volume
57
Issue
4
fYear
2010
fDate
4/1/2010 12:00:00 AM
Firstpage
801
Lastpage
807
Abstract
In this work the applicability of the coupling-of-modes (COM) approach to the analysis of thin AlN film plate acoustic resonators (FPAR), utilizing the S0 Lamb wave, is discussed. Analysis based on the Floquet-Bloch theorem as well as COM parameter extraction from a micromachined FPAR test structure are simultaneously used to verify the applicability of the COM approach. Finite element model simulation is used to further study the contribution of the higher order mass loading effects over the Lamb wave propagation under a periodical grating. A possibility to achieve zero sensitivity of the FPAR resonance with respect to the grating strip thickness is identified and physically interpreted for the first time.
Keywords
III-V semiconductors; acoustic wave propagation; aluminium compounds; finite element analysis; micromechanical resonators; semiconductor thin films; surface acoustic wave resonators; surface acoustic waves; thin film devices; wide band gap semiconductors; AlN; Floquet-Bloch theorem; Lamb wave propagation; S0 lamb mode; coupling-of-modes; finite element model simulation; mass loading effects; micromachined resonators; periodical grating; thin film microacoustic devices; thin film plate acoustic wave resonators; Acoustic testing; Acoustic waves; Finite element methods; Gratings; Parameter extraction; Resonance; Strips; Transistors;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2010.1484
Filename
5442874
Link To Document