• DocumentCode
    1461700
  • Title

    Coupling-of-modes analysis of thin film plate acoustic wave resonators utilizing the S0 Lamb mode

  • Author

    Yantchev, Ventsislav

  • Author_Institution
    Dept. of Solid State Electron., Uppsala Univ., Uppsala, Sweden
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    801
  • Lastpage
    807
  • Abstract
    In this work the applicability of the coupling-of-modes (COM) approach to the analysis of thin AlN film plate acoustic resonators (FPAR), utilizing the S0 Lamb wave, is discussed. Analysis based on the Floquet-Bloch theorem as well as COM parameter extraction from a micromachined FPAR test structure are simultaneously used to verify the applicability of the COM approach. Finite element model simulation is used to further study the contribution of the higher order mass loading effects over the Lamb wave propagation under a periodical grating. A possibility to achieve zero sensitivity of the FPAR resonance with respect to the grating strip thickness is identified and physically interpreted for the first time.
  • Keywords
    III-V semiconductors; acoustic wave propagation; aluminium compounds; finite element analysis; micromechanical resonators; semiconductor thin films; surface acoustic wave resonators; surface acoustic waves; thin film devices; wide band gap semiconductors; AlN; Floquet-Bloch theorem; Lamb wave propagation; S0 lamb mode; coupling-of-modes; finite element model simulation; mass loading effects; micromachined resonators; periodical grating; thin film microacoustic devices; thin film plate acoustic wave resonators; Acoustic testing; Acoustic waves; Finite element methods; Gratings; Parameter extraction; Resonance; Strips; Transistors;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2010.1484
  • Filename
    5442874