Title :
A novel inorganic scintillator: Lu2Si2O7 :Ce3+ (LPS)
Author :
Pauwels, D. ; Le Masson, N. ; Viana, B. ; Kahn-Harari, A. ; van Loef, E.V.D. ; Dorenbos, P. ; van Eijk, C.W.E.
Author_Institution :
Lab. de Chimie Appliquee de l´´Etat Solide, CNRS, Paris, France
fDate :
12/1/2000 12:00:00 AM
Abstract :
We have characterized the gamma and X-ray scintillation properties of Ce3+ doped Lu2Si2O7, a lutetium pyro-silicate (LPS) material. The rare earth ions are located in an octahedral site with C2 symmetry. The compound exhibits chemical stability, transparency in a wide optical range and congruent melting, which allows growing of single crystals of good optical quality. The melting temperature is about 2000°C, slightly lower than that of Lu2SiO5 (LSO). Two maxima at 305 nm and 355 nm are observed in the optical absorption spectrum. The emission spectrum of Ce3+ in LPS shows a broad band peaking at 380 nm. For a nominal Ce3+ atomic concentration of ~0.01, under gamma-ray excitation we observe light yields in the range 13000-23000 photons/MeV, depending on the preparation atmosphere. The actual cerium concentration inside the crystal still needs to be determined. The scintillation decay time is around 30 ns and, in the first studies, neither a long component nor afterglow was observed
Keywords :
X-ray detection; cerium; crystal growth from melt; gamma-ray detection; impurity absorption spectra; lutetium compounds; melting point; scintillation; solid scintillation detectors; 2000 C; 305 nm; 355 nm; 380 nm; Lu2Si2O7:Ce; X-ray scintillation properties; chemical stability; congruent melting; emission spectrum; gamma-ray scintillation properties; inorganic scintillator; light yields; melting temperature; octahedral site; optical absorption spectrum; scintillation decay time; single crystals growth; transparency; Atom optics; Chemical compounds; Crystalline materials; Crystals; Electromagnetic wave absorption; Optical materials; Particle beam optics; Stability; Stimulated emission; Temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on