• DocumentCode
    1462466
  • Title

    Broadband Dielectric Measurements on Highly Scattering Materials

  • Author

    Li, Zijing ; Sharma, Anjali ; Ayala, Ana I Medina ; Afsar, Mohammed N. ; Korolev, Konstantin A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
  • Volume
    59
  • Issue
    5
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    1397
  • Lastpage
    1405
  • Abstract
    Dielectric properties of highly scattering dyed corn meal have been studied in broadband microwave and millimeter-wave frequency ranges from 3.95 to 12.4 GHz and from 34 to 120 GHz. Complex dielectric permittivity has been obtained using a free-space quasi-optical spectroscopy technique and a standard waveguide transmission/reflection (T/R) calibration method. The broadband transmittance and reflectance spectra have been recorded to yield the refractive and absorption index and calculate the real and imaginary parts of dielectric permittivity. The density dependence of complex permittivity of highly scattering dyed corn meal is presented. Different scattering mechanisms and the scattering model for a corn meal material have been discussed. Detailed analysis of measurement uncertainties, including instrumentation errors, to manifest the accuracy of both techniques, has also been performed.
  • Keywords
    electromagnetic wave reflection; electromagnetic wave scattering; electromagnetic wave transmission; microwave spectra; permittivity measurement; broadband dielectric measurements; broadband microwave; dielectric permittivity; free space quasi-optical spectroscopy technique; frequency 3.95 GHz to 12.4 GHz; frequency 34 GHz to 120 GHz; highly scattering dyed corn meal; highly scattering materials; measurement uncertainty; millimeter wave frequency; reflectance spectra; scattering mechanisms; transmittance spectra; waveguide transmission/reflection calibration method; Calibration; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Millimeter wave measurements; Millimeter wave technology; Permittivity; Reflection; Scattering; Backward-wave oscillator (BWO); highly scattering material; uncertainty analysis; waveguide transmission/reflection (T/R) technique;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2038031
  • Filename
    5443481