Title :
Sensitivity Evaluation Method for Aerospace Digital Systems With Collaborative Hardening
Author :
Portela-García, Marta ; García-Valderas, Mario ; Millán, Enrique San ; López-Ongil, Celia ; Entrena, Luis ; Martin-Ortega, Alberto ; De Mingo, Jose Ramón ; Rodriguez, Santiago
Author_Institution :
Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
fDate :
6/1/2011 12:00:00 AM
Abstract :
Complexity of current digital systems and circuits involves new challenges in the field of hardening and measuring circuit´s sensitivity under SEEs. In this work, a new solution for evaluating the SEU sensitivity of space systems based on using programmable logic devices is proposed. This solution is able to perform a deep analysis of fault effects in systems with hardware functionality distribution, taking into account the high complexity of the hardware nodes (complex programmable logic devices) and their collaborative hardening properties.
Keywords :
aerospace components; digital systems; programmable logic devices; radiation hardening (electronics); SEE; SEU; aerospace digital system; circuit sensitivity measurment; collaborative hardening property; fault effect; hardware functionality distribution; programmable logic device; radiation effect; sensitivity evaluation method; single event upset; Circuit faults; Collaboration; Digital systems; Emulation; Hardware; Real time systems; Sensitivity; Aerospace applications; collaborative hardening; radiation sensitivity; single event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2109397
