Sensitivity Evaluation Method for Aerospace Digital Systems With Collaborative Hardening

Author

Portela-García, Marta ; García-Valderas, Mario ; Millán, Enrique San ; López-Ongil, Celia ; Entrena, Luis ; Martin-Ortega, Alberto ; De Mingo, Jose Ramón ; Rodriguez, Santiago

Author_Institution

Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain

Volume

58

Issue

3

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

1053

Lastpage

1058

Abstract

Complexity of current digital systems and circuits involves new challenges in the field of hardening and measuring circuit´s sensitivity under SEEs. In this work, a new solution for evaluating the SEU sensitivity of space systems based on using programmable logic devices is proposed. This solution is able to perform a deep analysis of fault effects in systems with hardware functionality distribution, taking into account the high complexity of the hardware nodes (complex programmable logic devices) and their collaborative hardening properties.

Keywords

aerospace components; digital systems; programmable logic devices; radiation hardening (electronics); SEE; SEU; aerospace digital system; circuit sensitivity measurment; collaborative hardening property; fault effect; hardware functionality distribution; programmable logic device; radiation effect; sensitivity evaluation method; single event upset; Circuit faults; Collaboration; Digital systems; Emulation; Hardware; Real time systems; Sensitivity; Aerospace applications; collaborative hardening; radiation sensitivity; single event upset (SEU);

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2011.2109397

Filename

5722067