Author :
Maloney, Timothy J. ; Parat, Krishna K. ; Clark, Neal K. ; Darwish, A.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Electrostatic discharge (ESD) protection of an integrated circuit´s (IC´s) high voltage power pins is achieved without damage to thin oxides by dividing the steady-state voltage and arranging weak forward bias of the diodes of a cantilever clamp. Also, V/sub pp/ programming pins are protected by cantilever clamps of various kinds, including some which turn on when breakdown is detected and turn off after V/sub cc/ is powered up.
Keywords :
EPROM; electrostatic discharge; integrated circuit modelling; power supply circuits; protection; EPROM; cantilever diode clamp; electrostatic discharge protection; high voltage power pin; integrated circuit power supply; programming pin; Biological system modeling; Circuits; Clamps; Diodes; Electrostatic discharge; Pins; Power supplies; Protection; Steady-state; Voltage;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
DOI :
10.1109/3476.739169
