• DocumentCode
    1462602
  • Title

    Inside front cover

  • Author

    Ishizuka, Hiroyasu ; Okuyama, Kousuke ; Kubota, Katsuhiko ; Komuro, Masamichi ; Hara, Yuji

  • Author_Institution
    Hatachi ULSI Syst. Co., Tokyo, Japan
  • Volume
    21
  • Issue
    4
  • fYear
    1998
  • Abstract
    We examined various electrostatic discharge (ESD) protection devices for input pins in the case of floating body substrates to discuss optimal structures effective to both of the machine model (MM) and human body model (HBRM) ESD stresses. Because of a small series resistance, we observed oscillation alternating from positive to negative in the current waveforms during MM stress, leading to weak polarity dependence of ESD performance which is inconsistent with the results for HEM tests. As a result, protection devices effective to both HEM and MM should be robust to bipolar stress. As one of the candidates, we propose a combination of PN diode and thyristor.
  • Keywords
    bipolar transistors; electrostatic discharge; integrated circuit testing; protection; semiconductor diodes; thyristors; ESD protection device; HBM test; MM test; PN diode; discharge; floating body substrate; human body model; input pin; lateral bipolar transistor; machine model; thyristor; Biological system modeling; Diodes; Electrostatic discharge; Humans; Immune system; Pins; Protection; Robustness; Stress; Testing;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4400
  • Type

    jour

  • DOI
    10.1109/3476.739170
  • Filename
    739170