• DocumentCode
    1462624
  • Title

    Protection of high voltage power and programming pins

  • Author

    Maloney, Timothy J. ; Parat, Krishna K. ; Clark, Neal K. ; Darwish, Ali

  • Author_Institution
    Intel Corporation, Santa Clara, CA 95052 USA
  • Volume
    21
  • Issue
    4
  • fYear
    1998
  • Firstpage
    250
  • Lastpage
    256
  • Abstract
    Electrostatic discharge (ESD) protection of an integrated circuit´s (IC´s) high voltage power pins is achieved without damage to thin oxides by dividing the steady-state voltage and arranging weak forward bias of the diodes of a cantilever clamp. Also, Vpp programming pins are protected by cantilever clamps of various kinds, including some which turn on when breakdown is detected and turn off after Vcc is powered up.
  • Keywords
    environmental factors; modelling; recycling; cannibalizing; end-of-life computer disposition; energy requirements; glass; high-grade parts; plastics; primary material source reduction; recycling; separated metals; Aluminum; Building materials; Computer aided manufacturing; Data engineering; Feeds; Inorganic materials; Plastics; Power engineering and energy; Recycling; Steel; Cantilever clamp; EPROM programming; ESD; charged device model; electrostatic discharge; electrostatic discharge protection; human body model; machine model; power supply ESD clamp;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4400
  • Type

    jour

  • DOI
    10.1109/3476.739174
  • Filename
    739174
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1462624