• DocumentCode
    1462675
  • Title

    Numerical Simulation of the Wind-Stress Effect on SAR Imagery of Far Wakes of Ships

  • Author

    Fujimura, Atsushi ; Soloviev, Alexander ; Kudryavtsev, Vladimir

  • Author_Institution
    Oceanogr. Center, Nova Southeastern Univ., Dania Beach, FL, USA
  • Volume
    7
  • Issue
    4
  • fYear
    2010
  • Firstpage
    646
  • Lastpage
    649
  • Abstract
    Centerline wakes of ships in synthetic aperture radar (SAR) images were modeled in 2-D with the computational fluid dynamics (CFD) software Fluent and a radar-imaging algorithm. We initialized the model with a pair of vortices generated by a ship hull and applied wind stress perpendicular to the ship wake. Results of the CFD simulation using a nonhydrostatic model have demonstrated ship-wake asymmetry with respect to the wind-stress direction relative to the ship course. Due to the wind stress, flow convergence increased on the upwind side of the centerline wake and reduced on the downwind side of the wake. The radar-imaging algorithm processed with the surface velocity field produced by the CFD model revealed ship-wake asymmetry relative to the wind direction. These results are qualitatively consistent with SAR images from the TerraSAR-X satellite and representative statistics of photographic images of the ship wake collected from a volunteer observing ship.
  • Keywords
    numerical analysis; radar imaging; ships; synthetic aperture radar; wakes; SAR imagery; computational fluid dynamics; far wakes of ships; flow convergence; numerical simulation; radar-imaging algorithm; ship-wake asymmetry; synthetic aperture radar; wind direction; wind-stress effect; Computational fluid dynamics; Computational modeling; Convergence; Marine vehicles; Numerical simulation; Satellites; Software algorithms; Statistics; Stress; Synthetic aperture radar; Hydrodynamics; numerical analysis; remote sensing; sea surface; synthetic aperture radar (SAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2010.2043920
  • Filename
    5443510