Title :
Testing point-contact transistors for pulse applications
Author_Institution :
General Electric Company, Advanced Electronics Center at Cornell University, Ithaca, N. Y.
Abstract :
Test methods are recommended and described. Conclusions are drawn regarding measurements for determination of proper application of transistors to large-signal pulse circuits.
Keywords :
Current measurement; Electrical resistance measurement; Integrated circuits; Resistance; Resistors; Transistors; Voltage measurement;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1954.6439073
