Common-mode failures in redundant VLSI systems: a survey

Author

Mitra, Subhasish ; Saxena, Nirmal R. ; McCluskey, Edward J.

Author_Institution

Center for Reliable Comput., Stanford Univ., CA, USA

Volume

49

Issue

3

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

285

Lastpage

295

Abstract

This paper presents a survey of CMF (common-mode failures) in redundant systems with emphasis on VLSI (very large scale integration) systems. The paper discusses CMF in redundant systems, their possible causes, and techniques to analyze reliability of redundant systems in the presence of CMF. Current practice and results on the use of design diversity techniques for CMF are reviewed. By revisiting the CMF problem in the context of VLSI systems, this paper augments earlier surveys on CMF in nuclear and power-supply systems. The need for quantifiable metrics and effective models for CMF in VLSI systems is re-emphasized. These metrics and models are extremely useful in designing reliable systems. For example, using these metrics and models, system designers and synthesis tools can incorporate diversity in redundant systems to maximize protection against CMF

Keywords

VLSI; failure analysis; redundancy; common-mode failures; nuclear systems; power-supply systems; quantifiable metrics; redundant VLSI systems; redundant systems diversity; reliability analysis; reliable systems design; survey; very large scale integration; Application specific integrated circuits; Computer aided software engineering; Computer errors; Design automation; Electromagnetic interference; Field programmable gate arrays; Power system modeling; Power system reliability; Redundancy; Very large scale integration;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.914545

Filename

914545