• DocumentCode
    1462855
  • Title

    Analytical model for electrical and thermal transients of self-heating semiconductor devices

  • Author

    Zhu, Yu. ; Twynam, John K. ; Yagura, Motoji ; Hasegawa, Masatomo ; Hasegawa, Takao ; Eguchi, Yoshihito ; Yamada, Atsushi ; Suematsu, Eiji ; Sakuno, Keiichi ; Sato, Hiroya ; Hashizume, Nobuo

  • Author_Institution
    Central Res. Labs., Sharp Corp., Nara, Japan
  • Volume
    46
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    2258
  • Lastpage
    2263
  • Abstract
    Transients of self-heating semiconductor devices are theoretically investigated based on a feedback circuit model, which is composed of three sub-circuits describing the isothermal electrical characteristics, thermal impedance, and temperature dependence of the electrical characteristics of the devices, respectively. Analytical expressions of the frequency and transient responses have been derived for both the electrical and thermal characteristics of self-heating devices, yielding accurate methods to extract the thermal time constant in both the time and frequency domains. The model is verified by the transient electrical-response measurement of a GaInP/GaAs heterojunction bipolar transistor
  • Keywords
    feedback; frequency response; frequency-domain analysis; heterojunction bipolar transistors; microwave bipolar transistors; semiconductor device models; time-domain analysis; transient analysis; GaInP-GaAs; electrical transients; feedback circuit model; frequency domain; frequency responses; heterojunction bipolar transistor; isothermal electrical characteristics; self-heating semiconductor devices; thermal impedance; thermal time constant; thermal transients; time domain; transient responses; Analytical models; Electric variables; Feedback circuits; Frequency domain analysis; Gain measurement; Impedance; Isothermal processes; Semiconductor devices; Temperature dependence; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.739207
  • Filename
    739207