Title : 
Millimeter-wave characteristics of flip-chip interconnects for multichip modules
         
        
            Author : 
Heinrich, Wolfgang ; Jentzsch, Andrea ; Baumann, Guido
         
        
            Author_Institution : 
Ferdinand-Braun-Inst. fur Hochstfrequenztech., Berlin, Germany
         
        
        
        
        
            fDate : 
12/1/1998 12:00:00 AM
         
        
        
        
            Abstract : 
Electromagnetic simulation and measurement data of flip-chip transitions are presented. First-order effects are identified and design criteria for millimeter-wave multichip interconnects are derived. Results cover chip detuning and bump geometry as well as simplified modeling. In a coplanar environment, the flip-chip scheme provides interconnects with excellent low-reflective properties. For conductor-backed structures, parasitic modes occur leading to unwanted crosstalk. These effects dominate the behavior so that overall performance of the flip-chip scheme can be evaluated properly only in conjunction with the actual motherboard packaging setup
         
        
            Keywords : 
MIMIC; crosstalk; finite difference methods; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; multichip modules; bump geometry; chip detuning; conductor-backed structures; coplanar environment; crosstalk; electromagnetic simulation; first-order effects; flip-chip interconnects; low-reflective properties; millimeter-wave characteristics; motherboard packaging setup; multichip modules; parasitic modes; Coplanar waveguides; Electromagnetic measurements; Electromagnetic modeling; Finite difference methods; Metallization; Millimeter wave measurements; Millimeter wave technology; Multichip modules; Packaging; Semiconductor device measurement;
         
        
        
            Journal_Title : 
Microwave Theory and Techniques, IEEE Transactions on