Title :
Dual Polarization Interferometric In-Band OSNR Measurement
Author :
Flood, Edward ; Guo, Wei-Hua ; Smyth, John Frank ; Lynch, Michael ; Bradley, Ann Louise ; Barry, Liam P. ; Donegan, John F.
Author_Institution :
Semicond. Photonics Group, Trinity Coll., Dublin, Ireland
fDate :
6/1/2012 12:00:00 AM
Abstract :
An in-band optical signal-to-noise ratio (OSNR) monitoring technique based on a Michelson fiber interferometer and a linear polarizer is presented in this letter. OSNR values of up to 25±0.5 dB were measured for 10-G nonreturn-to-zero-differential phase-OOK (NRZ-OOK) and NRZ-differential phase-shift keyed (NRZ-DPSK) signals without prior knowledge of the signal coherence properties. Measurements were also carried out with signals having 680 ps/nm of chromatic dispersion.
Keywords :
Michelson interferometers; differential phase shift keying; optical fibre dispersion; optical fibre polarisation; optical polarisers; optical variables measurement; Michelson fiber interferometer; NRZ-DPSK signals; NRZ-OOK signals; NRZ-differential phase-shift keyed signals; chromatic dispersion; dual polarization interferometry; in-band OSNR measurement; in-band optical signal-to-noise ratio monitoring; linear polarizer; nonreturn-to-zero-differential phase-OOK signals; signal coherence properties; Monitoring; Optical fibers; Optical interferometry; Optical noise; Semiconductor device measurement; Signal to noise ratio; Differential phase-shift keying; monitoring; optical fiber communication; optical fiber devices; optical fiber networks; optical interferometry;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2012.2189761
