Absolute potential measurements inside microwave digital IC´s using a micromachined photoconductive sampling probe

Author

David, Gerhard ; Yun, Tae-Yeoul ; Crites, Matthew H. ; Whitaker, John F. ; Weatherford, Todd R. ; Jobe, Kay ; Meyer, Scott ; Bustamante, Mario J. ; Goyette, Bill ; Thomas, Stephen, III ; Elliott, Kenneth R.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

46

Issue

12

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

2330

Lastpage

2337

Abstract

A measurement system for internal node testing of integrated circuits using a micromachined photoconductive sampling probe is described and characterized. Special emphasis is placed upon the system performance, demonstrating how absolute voltage measurements are achieved in a DC-to-MM-wave bandwidth. The feasibility of the setup is illustrated using an InP heterojunction bipolar transistor frequency divider. Detailed waveforms at different circuit nodes and the corresponding propagation delays from within this circuit at operating frequencies up to 10 GHz are presented. The results demonstrate for the first time the use of photoconductive probes for calibration-free, absolute-voltage, DC-coupled potential measurements in high-frequency and high-speed integrated circuits

Keywords

delays; digital integrated circuits; high-speed integrated circuits; integrated circuit testing; measurement by laser beam; microwave measurement; photoconducting devices; probes; signal sampling; test equipment; voltage measurement; 10 GHz; IC testing; InP HBT frequency divider; absolute potential measurements; heterojunction bipolar transistor frequency divider; high-frequency integrated circuits; high-speed integrated circuits; integrated circuits; internal node testing; measurement system; micromachined photoconductive sampling probe; microwave digital IC; propagation delays; Circuit testing; Digital integrated circuits; Integrated circuit measurements; Integrated circuit testing; Microwave integrated circuits; Microwave measurements; Photoconducting devices; Probes; Sampling methods; System testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.739220

Filename

739220