• DocumentCode
    1462952
  • Title

    Current-based testing for deep-submicron VLSIs

  • Author

    Sachdev, Manoj

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
  • Volume
    18
  • Issue
    2
  • fYear
    2001
  • Firstpage
    76
  • Lastpage
    84
  • Abstract
    Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales. However, unabated increases in leakage current in CMOS devices can make this testing very difficult. This article offers several solutions to this challenging problem
  • Keywords
    CMOS integrated circuits; VLSI; integrated circuit testing; CMOS devices; current-based testing; deep-submicron VLSIs; leakage current; transistor sensitivity; CMOS process; CMOS technology; Capacitance; Differential equations; Electronic equipment testing; Leakage current; MOSFETs; Temperature; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.914627
  • Filename
    914627
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1462952