DocumentCode :
1463334
Title :
Annealing at Different Temperatures of Silicon Microstrip Detectors After Severe Hadron Irradiation
Author :
Casse, Gianluigi ; Affolder, Anthony ; Allport, Philip P. ; Chmill, Valery ; Forshaw, Dean ; Greenall, Ashley ; Huse, Torkjell ; Tsurin, Ilya ; Wormald, Michael
Author_Institution :
Dept. of Phys., Univ. of Liverpool, Liverpool, UK
Volume :
59
Issue :
2
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
419
Lastpage :
424
Abstract :
Two rather recent results from studies performed for preparing high resolution sensors for the future supercolliders (HL-LHC at CERN) have proven that silicon detectors read out with low noise electronics can be used for tracking minimum ionizing particles (mip) after doses up to if high bias voltage and adequate cooling can be routed to the sensors. These are the discovery of the charge multiplication mechanism taking place in irradiated n-in-p silicon detectors and the suppression of the reverse annealing. A discussion of this last feature and the influence of the annealing temperature is presented here.
Keywords :
annealing; nuclear electronics; radiation effects; readout electronics; semiconductor counters; CERN; HL-LHC; annealing temperature; charge multiplication mechanism; future supercolliders; high resolution sensor preparation; irradiated n in p silicon detectors; low noise electronics; minimum ionizing particle tracking; mip; reverse annealing suppression; severe hadron irradiation; silicon detector readout; silicon microstrip detectors; Acceleration; Annealing; Detectors; Radiation effects; Silicon; Temperature sensors; HL-LHC; microstrip silicon detectors; radiation tolerance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2186316
Filename :
6164289
Link To Document :
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