40-GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization

Author

Teyssier, Jean-Pierre ; Bouysse, Philippe ; Ouarch, Zineb ; Barataud, Denis ; Peyretaillade, Thierry ; Quéré, Raymond

Author_Institution

IRCOM, Limoges Univ., France

Volume

46

Issue

12

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

2043

Lastpage

2052

Abstract

A versatile pulsed I(V) and 40-GHz RF measurement system is described with all the know-how and methods to perform efficient, safe, and reliable nonlinear transistor measurements. Capability of discrimination between thermal and trapping effects with a pulse setup is demonstrated. Capture and emission constant times of trapping effects are measured. A method to electrically measure the thermal resistance and capacitance of transistors with a pulse setup is proposed

Keywords

microwave measurement; microwave transistors; pulse measurement; semiconductor device measurement; 40 GHz; capacitance; isothermal nonlinear characteristics; microwave transistor; pulsed RF measurement system; thermal resistance; trap emission constant time; Capacitance measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Microwave measurements; Microwave transistors; Performance evaluation; Pulse measurements; Radio frequency; Thermal resistance;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.739281

Filename

739281