• DocumentCode
    1463420
  • Title

    Micromechanical tuning elements in a 620-GHz monolithic integrated circuit

  • Author

    Lubecke, Victor M. ; McGrath, William R. ; Stimson, Philip A. ; Rutledge, David B.

  • Author_Institution
    Div. of Eng. & Appl. Sci., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    46
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    2098
  • Lastpage
    2103
  • Abstract
    While monolithic integrated-circuit technology promises a practical means for realizing reliable reproducible planar millimeter and submillimeter-wave circuits, conventional planar circuits do not allow for critical post-fabrication optimization of performance. A 620-GHz quasi-optical monolithic detector circuit is used here to demonstrate the performance of two integrated micromechanical planar tuning elements. This is the first reported demonstration of integrated micromechanical tuning at submillimeter wavelengths. The tuning elements, called sliding planar backshorts (SPBs), are used to adjust the electrical length of planar transmission-line tuning stubs to vary the power delivered between a substrate-lens coupled planar antenna and a thin-film bismuth detector over a range of nearly 15 dB. The circuit performance agrees with theoretical calculations and microwave measurements of a -0.06-dB reflection coefficient made for a scale model of the integrated tuners. The demonstrated tuning range for the SPB tuners indicates that they can be valuable for characterizing components in developmental circuits and for optimizing the in-use performance of various millimeter and submillimeter-wave integrated circuits
  • Keywords
    MMIC; circuit tuning; micromechanical devices; submillimetre wave detectors; submillimetre wave integrated circuits; 620 GHz; micromechanical tuning element; monolithic submillimeter wave integrated circuit; planar antenna; planar transmission line; quasi-optical detector; sliding planar backshort; substrate lens; thin film bismuth detector; Circuit optimization; Detectors; Integrated circuit reliability; Integrated circuit technology; Micromechanical devices; Submillimeter wave integrated circuits; Submillimeter wave propagation; Submillimeter wave technology; Transmission lines; Tuners;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.739288
  • Filename
    739288