DocumentCode :
1463436
Title :
Studied variations
Volume :
48
Issue :
5
fYear :
2012
Firstpage :
249
Lastpage :
249
Abstract :
An IBM semiconductor R&D team have reported the effects of a SiGe channel on threshold voltage mismatch in a 32 nm high-k metal gate (HKMG) technology. They have found that the improved threshold voltage comes at an acceptable cost in terms of transistor mismatch.
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.0518
Filename :
6164307
Link To Document :
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