DocumentCode
1463495
Title
A simple method for blocking parasitic modes in a waveguide-packaged microstrip-line circuit
Author
Chen, Hao-Hui ; Wang, Chun-Long ; Chung, Shyh-Jong
Author_Institution
Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
46
Issue
12
fYear
1998
fDate
12/1/1998 12:00:00 AM
Firstpage
2156
Lastpage
2159
Abstract
A simple structure formed by two metal patches symmetrically deposited at the two sides of the center microstrip is proposed and analyzed for blocking the higher order modes in a waveguide-packaged microstrip-line circuit. The variations (with the patch width) of the effective dielectric constants and field distributions of the modes in the packaged microstrip line with infinitely long side patches were first investigated using the two-dimensional (2-D) finite-element method (FEM) and the method of lines. The results suggested that there exists a range of patch widths at which the field distributions of the higher order modes are totally different from those of the microstrip line without side patches. The scattering of the patches as a function of the patch length and width was then studied using the three-dimensional (3-D) FEM with edge elements. It has been found that by simply choosing appropriate patch sizes, the parasitic higher order mode can be reflected without sacrificing the normal propagation of the dominant mode
Keywords
finite element analysis; method of lines; microstrip circuits; packaging; permittivity; waveguide components; 2D FEM; 2D finite-element method; center microstrip; edge elements; effective dielectric constants; field distributions; higher order modes; metal patches; method of lines; parasitic modes blocking; patch width; scattering; waveguide-packaged microstrip-line circuit; Circuits; Dielectric constant; Electromagnetic interference; Electromagnetic propagation; Electromagnetic scattering; Electromagnetic waveguides; Finite element methods; Microstrip; Packaging; Two dimensional displays;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.739299
Filename
739299
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