DocumentCode :
1463554
Title :
Low-cost flip-chip on board
Author :
Baggerman, Antal F J ; Caers, Jo F J M ; Wondergem, Jan J. ; Wagemans, Antonius G.
Author_Institution :
Philips Centre for Manuf. Technol., Eindhoven, Netherlands
Volume :
19
Issue :
4
fYear :
1996
fDate :
11/1/1996 12:00:00 AM
Firstpage :
736
Lastpage :
746
Abstract :
For hand-held communication products, like the DECT telephone system, flip-chip on board offers minimization of both the package size and the occupied area on the boards. As a result of the reduction in interconnection lengths, the self-inductance is reduced. For high volume production, the compatibility of the flip-chip mounting technique with standard surface mount technology (SMT) reflow is essential. During reflow, the eutectic PbSn bump wets along the copper track, so the stand-off between integrated circuits (IC´s) and the board is accurately defined by the layout of the board and the dimensions of the bump. The eutectic PbSn flip-chip processing is evaluated by impedance and cross-talk measurements, and in several reliability tests. For the electrical measurements, a zero-IF front-end IC is used. Wide-band measurements of the input impedance showed that the residual parasitics associated with the eutectic PbSn bumps are negligible compared with the parameters of the internal IC components. To accommodate the residual stresses from differences in coefficient of thermal expansion (CTE), the gap between the IC and the substrate is underfilled. This underfill material marginally affects the electrical behavior of the IC at frequencies up to a few GHz. As expected, a slight increase in the residual capacitance is observed. The effect of the underfill is studied by both temperature cycle and shock tests; cumulative failure distributions have been plotted. Results show that the adhesion properties and flow characteristics of the underfill material are the dominating factors for the number of cycles to failure. By selecting the proper underfill and curing conditions, the eutectic PbSn flip-chip construction can meet the test requirements for consumer communication products
Keywords :
eutectic alloys; flip-chip devices; integrated circuit packaging; integrated circuit reliability; lead alloys; printed circuit manufacture; reflow soldering; surface mount technology; tin alloys; DECT telephone system; PbSn; adhesion; capacitance; coefficient of thermal expansion; crosstalk; curing; eutectic PbSn bump; failure; flip-chip on board; hand-held communication product; impedance; integrated circuit; interconnection; package; parasitics; reliability; residual stress; self-inductance; shock testing; surface mount technology reflow; temperature cycling; underfill; Impedance measurement; Integrated circuit interconnections; Integrated circuit layout; Integrated circuit measurements; Minimization; Packaging; Production; Surface-mount technology; Telephony; Testing;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.544364
Filename :
544364
Link To Document :
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