Burst-Error Analysis of Dual-Hop Fading Channels Based on the Second-Order Channel Statistics

Author

Chau, Yawgeng A. ; Huang, Karl Y T

Author_Institution

Dept. of Commun. Eng., Yuan Ze Univ., Chungli, Taiwan

Volume

59

Issue

6

fYear

2010

fDate

7/1/2010 12:00:00 AM

Firstpage

3108

Lastpage

3115

Abstract

The burst-error (BE) rate of dual-hop fading channels under a fixed fade threshold is estimated based on the level crossing rate (LCR) and average fade duration (AFD). The LCR and AFD of the equivalent signal-to-noise ratio (SNR) are first derived for dual-hop Nakagami-m and Weibull fading channels with a fixed-gain amplify-and-forward (AF) relay, where closed-form lower and upper bounds are derived for the LCR and AFD of the Nakagami-m fading channels. Numerical results from theoretical evaluations and Monte Carlo simulations are illustrated to validate the analysis and to compare the performance of the two fading channels.

Keywords

Monte Carlo methods; Nakagami channels; error statistics; higher order statistics; Monte Carlo simulations; Weibull fading channels; average fade duration; burst-error rate analysis; closed-form lower bounds; dual-hop Nakagami-m fading channels; dual-hop fading channels; equivalent signal-to-noise ratio; fixed fade threshold estimation; fixed-gain amplify-and-forward relay; level crossing rate; second-order channel statistics; upper bounds; Average fade duration (AFD); Nakagami- $m$ fading; Weibull fading; burst-error (BE) rate; dual-hop channel; level crossing rate (LCR);

fLanguage

English

Journal_Title

Vehicular Technology, IEEE Transactions on

Publisher

ieee

ISSN

0018-9545

Type

jour

DOI

10.1109/TVT.2010.2047416

Filename

5443643