Title :
Review on materials, microsensors, systems and devices for high-temperature and harsh-environment applications
Author :
Werner, Matthias Ralf ; Fahrner, Wolfgang R.
Author_Institution :
Microtechnol. Innovation Team, Deutsche Bank AG, Berlin, Germany
fDate :
4/1/2001 12:00:00 AM
Abstract :
The considerable investment in silicon technology has rarely addressed device use in harsh environments such as high temperatures, aggressive media, and radiation exposure. A clear future requirement is to save weight, volume, and reduce costs in “unfriendly” environments like high temperatures. This can be achieved either by cooling systems or by electronic microsystem components suited to withstand high temperatures. The current status of cooling systems, harsh-environment sensors, and microsystems in view of markets, realized devices, material, properties, process maturity, and packaging technologies are reviewed. Possible semiconductor candidates for high-temperature applications are discussed. The main obstacles for the future of high-temperature and harsh-environment microsystems is highlighted
Keywords :
III-V semiconductors; cooling; diamond; gallium compounds; microsensors; semiconductor device metallisation; semiconductor device packaging; semiconductor materials; semiconductor-metal boundaries; silicon compounds; C; GaN; SiC; aggressive media; cooling systems; diodes; electronic microsystem components; harsh-environment; harsh-environment sensors; high-temperature; metal-semiconductor contacts; microsensors; microsystems; packaging technologies; piezoresistive devices; process maturity; radiation exposure; semiconductor device metallisation; semiconductor device packaging; silicon technology; thermal factors; transistors; Consumer electronics; Costs; Electronics cooling; Electronics packaging; Investments; Microsensors; Semiconductor materials; Sensor systems; Silicon; Temperature sensors;
Journal_Title :
Industrial Electronics, IEEE Transactions on