DocumentCode :
1464065
Title :
Low-Cost Calibration Techniques for Smart Temperature Sensors
Author :
Pertijs, Michiel A P ; Aita, André L. ; Makinwa, Kofi A A ; Huijsing, Johan H.
Author_Institution :
DIMES, Delft Univ. of Technol., Delft, Netherlands
Volume :
10
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1098
Lastpage :
1105
Abstract :
Smart temperature sensors generally need to be trimmed to obtain measurement errors below ±2°C. The associated temperature calibration procedure is time consuming and therefore costly. This paper presents two, much faster, voltage calibration techniques. Both make use of the fact that a voltage proportional to absolute temperature (PTAT) can be accurately generated on chip. By measuring this voltage, the sensor´s actual temperature can be determined, whereupon the sensor can be trimmed to correct for its dominant source of error: spread in the on-chip voltage reference. The first calibration technique consists of measuring the (small) PTAT voltage directly, while the second, more robust alternative does so indirectly, by using an external reference voltage and the on-chip ADC. Experimental results from a prototype fabricated in 0.7 ¿m CMOS technology show that after calibration and trimming, these two techniques result in measurement errors (±3¿) of ±0.15°C and ±0.25°C, respectively, in a range from -55°C to 125°C.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; intelligent sensors; temperature sensors; CMOS technology; absolute temperature; analog-digital converter; calibration techniques; external reference voltage; size 0.7 mum; smart temperature sensors; temperature -55 C to 125 C; voltage calibration technique; CMOS technology; Calibration; Costs; Error correction; Intelligent sensors; Measurement errors; Semiconductor device measurement; Temperature distribution; Temperature sensors; Voltage measurement; Bipolar transistors; calibration; temperature sensors; trimming;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2010.2040730
Filename :
5443717
Link To Document :
بازگشت