DocumentCode
1464071
Title
Design, Fabrication, and Characteristics of a MEMS Micromirror With Sidewall Electrodes
Author
Bai, Yanhui ; Yeow, John T W ; Wilson, Brian C.
Author_Institution
Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
Volume
19
Issue
3
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
619
Lastpage
631
Abstract
This paper presents a 2-DOF silicon-on-insulator (SOI) microelectromechanical systems (MEMS) mirror with sidewall (SW) electrodes. The biaxial MEMS mirror with SW is actuated by electrostatic actuators. The dimension of mirror plate is 1000??m ?? 1000??m, with a thickness of 35 ??m. The analytical modeling, fabrication process, and performance characteristics are described. This paper analyzes the effects of the three-end single crystal serpentine torsion bar width and the bottom and SW electrodes on the performance of the mirror. A new fabrication process based on SOI wafer, hybrid bulk/surface micromachined technology, and a high-aspect-ratio shadow mask is presented. In comparison to previous fabrication processes and the Optical iMEMS process, the process is novel, easily understood, and simple to realize. The measured maximum angular deflection achieved is ??11??(mechanical angle) at a static operating voltage and is ?? 21??(mechanical angle) at resonance frequency driving. This mirror is well suited for applications where these characteristics are critical, such as in confocal or endoscopic scanning elements
Keywords
micromechanical devices; micromirrors; silicon-on-insulator; MEMS micromirror; SOI wafer; confocal scanning elements; electrostatic actuators; endoscopic scanning elements; high-aspect-ratio shadow mask; hybrid bulk-surface micromachined technology; microelectromechanical systems mirror; sidewall electrodes; silicon-on-insulator; size 35 mum; three-end single crystal serpentine torsion bar width; High-aspect-ratio shadow mask; microelectromechanical systems (MEMS) micromirror; serpentine torsion bar; sidewall (SW) electrodes;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2010.2044139
Filename
5443718
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