DocumentCode :
1464126
Title :
Transient response testing of analogue components in mixed-signal systems: a review
Author :
Taylor, D.
Author_Institution :
Dept. of Electr. & Electron. Eng., Huddersfield Univ., UK
Volume :
145
Issue :
5
fYear :
1998
fDate :
10/1/1998 12:00:00 AM
Firstpage :
314
Lastpage :
318
Abstract :
Transient response testing has developed over the last few years from a benchtop characterisation technique into a very powerful production test technique for all types of analogue components in mixed-signal electronic systems. The author reviews recent progress in this area, summarising results from both simulations and work on real circuits, then briefly describes the directions in which current research work is progressing
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; production testing; transient response; analogue component; mixed signal electronic system; production testing; review; transient response testing;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2409
Type :
jour
DOI :
10.1049/ip-cds:19982007
Filename :
739673
Link To Document :
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