DocumentCode :
1464169
Title :
Wide-bandwidth millimeter-wave bond-wire interconnects
Author :
Budka, Thomas P.
Author_Institution :
M/A COM Res. & Dev., Lowell, MA, USA
Volume :
49
Issue :
4
fYear :
2001
fDate :
4/1/2001 12:00:00 AM
Firstpage :
715
Lastpage :
718
Abstract :
A new type of interconnect has been developed that significantly extends the bandwidth of fixed-length bond-wire interconnects between microwave circuits. This interconnect maximizes bond-wire length, as well as landing pad size while simultaneously extending the cutoff frequency of the interconnect. The bond-wire interconnect is treated as a five-stage low-pass filter where basic filter theory is used to develop an interconnect prototype. Microstrip interconnects are designed using electromagnetic simulators, which match a specific low-pass filter response on a 5-mil thick (127 μm) glass substrates. The measurements indicate a return loss greater than 12 dB and an insertion loss from 0.0 to 0.3 dB from DC to 80 GHz using two 17-mil-long (432 μm) 1-mil-diameter (25 μm) ball bonds with a tolerance of ±2 mil (50 μm). For comparison, an uncompensated interconnect with two 17-mil-long (432 μm) bond wires has 1-dB insertion loss and 10-dB return loss at 40 GHz and continues to degrade at higher frequencies
Keywords :
compensation; equivalent circuits; integrated circuit interconnections; lead bonding; low-pass filters; millimetre wave integrated circuits; 0 to 12 dB; 0 to 80 GHz; 25 to 432 micron; EHF; MM-wave bond-wire interconnects; ball bonds; bond-wire length; cutoff frequency; electromagnetic simulators; filter theory; five-stage low-pass filter; glass substrates; landing pad size; low-pass filter response; microstrip interconnects; millimeter-wave interconnects; wideband bond-wire interconnects; Bandwidth; Bonding; Filtering theory; Insertion loss; Integrated circuit interconnections; LAN interconnection; Low pass filters; Microwave circuits; Microwave filters; Millimeter wave circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.915447
Filename :
915447
Link To Document :
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