• DocumentCode
    1464658
  • Title

    Near-linear wirelength estimation for FPGA placement

  • Author

    Xu, M. ; Grewal, G. ; Areibi, S. ; Obimbo, C. ; Banerji, D.

  • Author_Institution
    Sch. of Comput. Sci., Univ. of Guelph, Guelph, ON, Canada
  • Volume
    34
  • Issue
    3
  • fYear
    2009
  • Firstpage
    125
  • Lastpage
    132
  • Abstract
    With rapid advances in integrated circuit technology, wirelength has become one of the most critical and important metrics in all phases of VLSI physical design automation, especially circuit placement. As the precise wirelength for a given placement can only be known after routing, accurate and fast-to-compute wirelength estimates are required by FPGA placement algorithms. In this paper, a new model, called star+, is presented for estimating wirelength during FPGA placement. The proposed model is continuously differentiable and can be used with both analytic and iterative-improvement placement methods. Moreover, the time required to calculate incremental changes in cost incurred by moving/swapping blocks can always be computed in O(1) time. Results show that when incorporated into the well-known VPR framework and tested using the 20 MCNC benchmarks, the star+ model achieves a 6-9% reduction in critical-path delay compared with the half-perimeter wirelength (HPWL) model, while requiring roughly the same amount of computational effort.
  • Keywords
    VLSI; field programmable gate arrays; integrated circuit design; integrated circuit modelling; 20 MCNC benchmarks; FPGA placement algorithm; VLSI physical design automation; VPR framework; critical-path delay; half-perimeter wirelength model; incremental cost change calculation; integrated circuit technology; iterative-improvement placement method; moving blocks; near linear wirelength estimation; star+ model; swapping blocks; Cost function; Delay; Energy consumption; Field programmable gate arrays; Integrated circuit interconnections; Integrated circuit technology; Logic arrays; Logic devices; Routing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electrical and Computer Engineering, Canadian Journal of
  • Publisher
    ieee
  • ISSN
    0840-8688
  • Type

    jour

  • DOI
    10.1109/CJECE.2009.5443860
  • Filename
    5443860