Title :
Microwave diversity imaging using six-port reflectometer
Author :
Lu, Hsin-Chia ; Chu, Tah-Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
1/1/1999 12:00:00 AM
Abstract :
A microwave diversity imaging system conventionally uses a vector network analyzer (VNA) to directly measure the object scattered field (amplitude and phase) over a selected frequency range and viewing angles, then reconstructs the scattering object characteristic function through two dimensional Fourier inversion. In this paper, we present a cost-effective microwave diversity imaging system using a six-port reflectometer, which measures four amplitude (or power) values to acquire the object scattered field indirectly. One can then eliminate the coherent detectors in a VNA. The calibration procedure for this microwave diversity imaging measurement is also described. Experimental results of three types of scattering objects, a metallic cylinder, four distributed line scatterers, and a 72:1 scaled B-52 aircraft model, are presented using the described six-port microwave imaging system
Keywords :
calibration; electromagnetic wave scattering; image reconstruction; microwave imaging; microwave reflectometry; reflectometers; B-52 aircraft model; calibration procedure; distributed line scatterers; metallic cylinder; microwave diversity imaging; object scattered field; six-port reflectometer; Detectors; Frequency diversity; Frequency measurement; Image analysis; Image reconstruction; Microwave imaging; Microwave measurements; Phase measurement; Power measurement; Scattering;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on