• DocumentCode
    1464819
  • Title

    Microwave diversity imaging using six-port reflectometer

  • Author

    Lu, Hsin-Chia ; Chu, Tah-Hsiung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    47
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    84
  • Lastpage
    87
  • Abstract
    A microwave diversity imaging system conventionally uses a vector network analyzer (VNA) to directly measure the object scattered field (amplitude and phase) over a selected frequency range and viewing angles, then reconstructs the scattering object characteristic function through two dimensional Fourier inversion. In this paper, we present a cost-effective microwave diversity imaging system using a six-port reflectometer, which measures four amplitude (or power) values to acquire the object scattered field indirectly. One can then eliminate the coherent detectors in a VNA. The calibration procedure for this microwave diversity imaging measurement is also described. Experimental results of three types of scattering objects, a metallic cylinder, four distributed line scatterers, and a 72:1 scaled B-52 aircraft model, are presented using the described six-port microwave imaging system
  • Keywords
    calibration; electromagnetic wave scattering; image reconstruction; microwave imaging; microwave reflectometry; reflectometers; B-52 aircraft model; calibration procedure; distributed line scatterers; metallic cylinder; microwave diversity imaging; object scattered field; six-port reflectometer; Detectors; Frequency diversity; Frequency measurement; Image analysis; Image reconstruction; Microwave imaging; Microwave measurements; Phase measurement; Power measurement; Scattering;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.740082
  • Filename
    740082