DocumentCode
1464848
Title
ATM switching architectures for wafer-scale integration
Author
Mir-Fakhraei, Nader
Author_Institution
Adv. Telecommun. Inst., Stevens Inst. of Technol., Hoboken, NJ, USA
Volume
4
Issue
4
fYear
1996
Firstpage
464
Lastpage
471
Abstract
This paper proposes the use of wafer-scale integration (WSI) technology for ATM switching systems and presents two different switching architectures specifically designed for WSI. WSI is particularly useful for switching networks since the interconnection lengths are minimized when the entire network is laid out on a single semiconductor wafer. We propose a defect-tolerant multipath buffered crossbar (MBC) with an expandable structure which can easily be scaled up or down according to the choice of wafer size. We also design an ATM-based Manhattan-street network (MSN) as an alternative architecture, suitable for wafer-scale implementation. We compare the two architectures from different standpoints such as performance, defect-tolerance, delay, practicality, testability, complexity, yield, and area.
Keywords
B-ISDN; asynchronous transfer mode; delays; digital integrated circuits; electronic switching systems; integrated circuit reliability; semiconductor switches; switching networks; wafer-scale integration; ATM switching architectures; Manhattan-street network; WSI technology; defect-tolerant multipath buffered crossbar; delay; expandable structure; semiconductor wafer; testability; wafer-scale integration; yield; Asynchronous transfer mode; Delay; Switching systems; Testing; Wafer scale integration;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/92.544411
Filename
544411
Link To Document