• DocumentCode
    1464848
  • Title

    ATM switching architectures for wafer-scale integration

  • Author

    Mir-Fakhraei, Nader

  • Author_Institution
    Adv. Telecommun. Inst., Stevens Inst. of Technol., Hoboken, NJ, USA
  • Volume
    4
  • Issue
    4
  • fYear
    1996
  • Firstpage
    464
  • Lastpage
    471
  • Abstract
    This paper proposes the use of wafer-scale integration (WSI) technology for ATM switching systems and presents two different switching architectures specifically designed for WSI. WSI is particularly useful for switching networks since the interconnection lengths are minimized when the entire network is laid out on a single semiconductor wafer. We propose a defect-tolerant multipath buffered crossbar (MBC) with an expandable structure which can easily be scaled up or down according to the choice of wafer size. We also design an ATM-based Manhattan-street network (MSN) as an alternative architecture, suitable for wafer-scale implementation. We compare the two architectures from different standpoints such as performance, defect-tolerance, delay, practicality, testability, complexity, yield, and area.
  • Keywords
    B-ISDN; asynchronous transfer mode; delays; digital integrated circuits; electronic switching systems; integrated circuit reliability; semiconductor switches; switching networks; wafer-scale integration; ATM switching architectures; Manhattan-street network; WSI technology; defect-tolerant multipath buffered crossbar; delay; expandable structure; semiconductor wafer; testability; wafer-scale integration; yield; Asynchronous transfer mode; Delay; Switching systems; Testing; Wafer scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.544411
  • Filename
    544411