Characterization of high-Q resonators for microwave filter applications

Author

Kwok, Raymond S. ; Liang, Ji-Fuh

Author_Institution

Space Syst./Loral, Palo Alto, CA, USA

Volume

47

Issue

1

fYear

1999

fDate

1/1/1999 12:00:00 AM

Firstpage

111

Lastpage

114

Abstract

A one-port reflection technique is developed to measure the unloaded Q and external Q of a microwave resonator. The unique procedure of measuring unloaded Q is outlined in three easy steps. A sample chart is provided to further simplify the process. This method is so simple that even a scalar network analyzer is adequate for the measurement. In addition, a time-delay response around the resonator resonant frequency is also derived and presented. This theoretical result, combined with the advanced capability of modern vector network analyzers, has been proven to be very useful for characterization and tuning of the external Q of a resonator. All the results derived are verified by practical measurement. Finally, this technique is applied to the realization and tuning of a six-pole dielectric loaded cavity filter

Keywords

Q-factor; cavity resonator filters; dielectric-loaded waveguides; microwave filters; microwave measurement; network analysers; external Q; high-Q resonators; microwave filter applications; one-port reflection technique; scalar network analyzer; six-pole dielectric loaded cavity filter; time-delay response; unloaded Q; vector network analyzers; Coupling circuits; Equivalent circuits; Inverters; Microwave devices; Microwave filters; Microwave measurements; Phase measurement; Reflection; Resonator filters; Tuning;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.740093

Filename

740093