DocumentCode :
1464970
Title :
1-Tbyte/s 1-Gbit DRAM Architecture Using 3-D Interconnect for High-Throughput Computing
Author :
Sekiguchi, Tomonori ; Ono, Kazuo ; Kotabe, Akira ; Yanagawa, Yoshimitsu
Author_Institution :
Eur. R&D Centre, Hitachi Eur. Ltd., Maidenhead, UK
Volume :
46
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
828
Lastpage :
837
Abstract :
Aiming to resolve memory bottlenecks in multi-core system, novel 1-Tbyte/s 1-Gbit DRAM architecture based on a multi-core configuration and 3-D interconnects was developed. The DRAM stacked on a multi-core CPU has 512-bit I/Os with through-silicon-via (TSV) distributed in 16 memory cores. Five-stage pipelined architecture in the compact DRAM core was developed to reduce the operation cycle of the data-bus to 2 ns. A low-noise early-bar-write scheme for an 8-ns cycle array operation and 16-Gbit/s I/O circuits on TSV were also developed. The proposed DRAM architecture greatly improves power efficiency. TSV scheme reduces the parasitic capacitance of the interconnects between the DRAM and CPU, and multi-core architecture reduces the length of the data bus on the DRAM. A 1-Gbit DRAM was designed based on the 45-nm stand-alone DRAM process. Chip size is 51.6 mm2 assuming 4F2 memory cells, and the density is about 5 times higher than that of embedded DRAM. Circuit simulations confirmed the 2-ns operation of the data bus, 8-ns operation of the memory array, and 16-Gbit/s operation of I/O circuits. Power consumption is 19.5 W, providing power efficiency of 51.3 Gbyte/s/W, which is an order of magnitude higher than that of conventional DRAMs.
Keywords :
DRAM chips; multiprocessing systems; pipeline processing; power aware computing; storage management; 1-Gbit DRAM architecture; 1-Tbyte DRAM; 16-Gbit/s I/O circuits; 16-Gbit/s operation; 3D interconnect; 512-bit I/O; 8-ns cycle array operation; TSV; five stage pipelined architecture; high throughput computing; low noise early bar write scheme; memory bottleneck; memory cores; multicore CPU; multicore architecture; multicore configuration; parasitic capacitance reduction; power 19.5 W; power efficiency improvement; Arrays; Multicore processing; Power demand; Random access memory; Through-silicon vias; Throughput; 3D inter connect; DRAM; TSV; multi-core; pipeline;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2011.2109630
Filename :
5723774
Link To Document :
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