DocumentCode
1465581
Title
A variable frequency method for wide-band microwave material characterization
Author
Mattar, K.E. ; Brodwin, M.E.
Author_Institution
Dept. of Phys., Calgary Univ., Alta., Canada
Volume
39
Issue
4
fYear
1990
fDate
8/1/1990 12:00:00 AM
Firstpage
609
Lastpage
614
Abstract
A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented
Keywords
microwave measurement; permittivity measurement; polymers; silicon; Si; Teflon; complex permittivity spectra; frequency swept sources; optimization of sensitivity; polymers; variable frequency method; variable reactance termination; wide-band microwave material characterization; Circuits; Coaxial components; Dielectric measurements; Frequency; Microwave measurements; Microwave theory and techniques; Optical reflection; Permittivity measurement; Tuning; Wideband;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.57242
Filename
57242
Link To Document