Abstract :
Application specific integrated circuits (ASICs) have been one of the electronics success stories of the 1980s. The rise in their complexity means that chips are now so complex that it is no longer feasible for a test engineer to understand the design at the level of detail required to generate a test program. ASIC designers are increasingly assuming responsibility for test program development. Fault simulation is discussed and automatic test-vector generation and on-chip test circuits are reviewed
