DocumentCode
1465709
Title
Selected Wit & Wisdom
Volume
47
Issue
3
fYear
1998
Firstpage
402
Lastpage
405
Keywords
Calendars; Electronic switching systems; Physics; Probability; Process control; Production; Reliability engineering; Statistics; Tellurium; Testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1998.740558
Filename
740558
Link To Document