• DocumentCode
    1465758
  • Title

    Simple method for estimating neutron-induced soft error rates based on modified BGR model

  • Author

    Tosaka, Y. ; Kanata, H. ; Satoh, S. ; Itakura, T.

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • Volume
    20
  • Issue
    2
  • fYear
    1999
  • Firstpage
    89
  • Lastpage
    91
  • Abstract
    Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We propose a simple model to estimate the neutron-induced soft error rates (SER´s), which is a modified version of the burst generation rate (BGR) model. Our model can be used to easily and quickly estimate neutron-induced soft error rates and provides a useful guideline for device and circuit engineers to estimate neutron-induced soft errors (SE´s),.
  • Keywords
    cosmic ray interactions; errors; neutron effects; burst generation rate model; cosmic ray neutron irradiation; soft error rate; Atmospheric modeling; Circuit simulation; Cosmic rays; Error analysis; Guidelines; Logic circuits; Neutrons; Nuclear electronics; Sea level; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.740661
  • Filename
    740661