• DocumentCode
    1465929
  • Title

    Ray Projection for Recovering Projective Transformations and Illumination Changes

  • Author

    Zhang, Yun ; Chu, Chee Hung Henry

  • Author_Institution
    Center for Adv. Comput. Studies, Univ. of Louisiana at Lafayette, Lafayette, LA, USA
  • Volume
    33
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    446
  • Lastpage
    458
  • Abstract
    The ray projection and its application to recovering a projective geometric transformation and an affine lighting change between two objects are mathematically studied. A novel technique, viz., variable contour, is proposed for accurately evaluating the ray projection. Moreover, a novel flexible framework of the ray projection is devised for the joint recovery of the eight parameters for the projective transformation and the two parameters for the lighting change. Finally, the framework is experimentally evaluated by recovering a variety of geometric and photometric transformations between real images of indoor and outdoor scenes. Its robustness to image blur and occlusion is demonstrated. Its versatility is illustrated through matching different objects in different classes.
  • Keywords
    affine transforms; computational geometry; feature extraction; hidden feature removal; image matching; image restoration; affine lighting; image blur; objects matching; occlusion; photometric transformation; projective geometric transformation; ray projection; Computer vision; Feature extraction; Image matching; Image motion analysis; Layout; Lighting; Photometry; Robustness; Stereo vision; Image matching; image motion analysis; lighting change; projective transformation; stereo vision.; Algorithms; Artificial Intelligence; Depth Perception; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Lighting; Models, Theoretical; Pattern Recognition, Automated; Projective Techniques; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.96
  • Filename
    5444891