DocumentCode
1465967
Title
GaN Avalanche Photodectors: A Full Band Monte Carlo Study of Gain, Noise and Bandwidth
Author
Moresco, Michele ; Bertazzi, Francesco ; Bellotti, Enrico
Author_Institution
Electron. & Commun. Eng. Dept., Boston Univ., Boston, MA, USA
Volume
47
Issue
4
fYear
2011
fDate
4/1/2011 12:00:00 AM
Firstpage
447
Lastpage
454
Abstract
This paper presents a theoretical study of the performance of GaN-based avalanche photodetectors using an ensemble Monte Carlo method. The model includes the details of the full band structure derived from nonlocal empirical pseudopotential calculations. Carrier-phonon and impact ionization scattering rates are obtained from the calculated electronic structure and from a first-principles study of the lattice dynamics. Multiplication gain, noise and bandwidth properties of back- and front-illuminated structures are evaluated by means of full band Monte Carlo simulation for different crystal orientations and multiplication region thicknesses. The simulation results indicate that hole injection in devices grown along the Γ-A direction provides the most favorable operating condition in terms of gain and noise. Finally, gain saturation effects due to electric field screening induced by photogenerated carriers are discussed.
Keywords
III-V semiconductors; Monte Carlo methods; ab initio calculations; avalanche photodiodes; band structure; gallium compounds; impact ionisation; optical noise; optical saturation; photoconducting devices; photodetectors; semiconductor device models; semiconductor device noise; wide band gap semiconductors; Γ-A direction; GaN; avalanche photodetectors; carrier-phonon ionization scattering rates; crystal orientations; electric field screening; electronic structure; first-principles study; full band Monte Carlo study; gain saturation effects; hole injection; impact ionization scattering rates; lattice dynamics; multiplication bandwidth; multiplication gain; multiplication noise; nonlocal empirical pseudopotential calculations; photogenerated carriers; Charge carrier processes; Color; Gain; Gallium nitride; Ionization; Monte Carlo methods; Noise; Avalanche photodetectors; GaN; Monte Carlo; frequency response; gain saturation; multiplication gain; numerical simulation;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2010.2091257
Filename
5724797
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