Title : 
Characteristics of High-Performance Ambipolar Organic Field-Effect Transistors Based on a Diketopyrrolopyrrole-Benzothiadiazole Copolymer
         
        
            Author : 
Ha, Tae-Jun ; Sonar, Prashant ; Singh, Samarendra P. ; Dodabalapur, Ananth
         
        
            Author_Institution : 
Univ. of Texas at Austin, Austin, TX, USA
         
        
        
        
        
            fDate : 
5/1/2012 12:00:00 AM
         
        
        
        
            Abstract : 
In this paper, we report the device characteristics of ambipolar thin-film transistors (TFTs) based on a diketopyrrolopyrrole-benzothiadiazole copolymer. This polymer semiconductor exhibits the largest comparable electron and hole mobility values in a single organic semiconductor. The key to realizing such high mobility values, which are >;0.5 cm2 / V · s, is molecular design, i.e., the use of suitable surface treatments of the source/drain contact electrodes and device architectures, particularly top-gate configurations. The subthreshold characteristics of the TFT devices are greatly improved by the use of dual-gate device geometry. We also report the first measurement of the velocity distribution of electron and hole velocities in an ambipolar organic semiconductor.
         
        
            Keywords : 
bipolar transistors; organic field effect transistors; polymer blends; velocity measurement; bipolar TFT devices; diketopyrrolopyrrole-benzothiadiazole copolymer; dual-gate device geometry; electron mobility values; high-performance ambipolar organic field-effect transistors; hole mobility values; hole velocity; polymer semiconductor; single organic semiconductor; source-drain contact electrodes; top-gate configurations; velocity distribution measurement; Charge carrier processes; Current measurement; Electrodes; Logic gates; Materials; Semiconductor device measurement; Thin film transistors; Ambipolar organic semiconductors; charge transport; dual-gate structure; organic field-effect transistor (FET); velocity distribution;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TED.2012.2186613