Enhanced Flux Pinning in YBCO+YSZ Composite Films Grown by TFA-MOD Method

Author

Ye, Shuai ; Suo, Hongli ; Liu, Min ; Tang, Xiao ; Wang, Rong ; Wu, Ziping ; Zhou, Meiling

Author_Institution

Coll. of Mater. Sci. & Eng., Beijing Univ. of Technol., Beijing, China

Volume

20

Issue

3

fYear

2010

fDate

6/1/2010 12:00:00 AM

Firstpage

1573

Lastpage

1576

Abstract

More attention was paid to the fact that columnar defects generated by introducing nano-particles into YBCO films can improve the in-field superconducting properties of YBCO as pinning centers. Epitaxial YBCO films with self-assembled Yttrium-stabilized Zirconia (YSZ) nano-particles have been successfully prepared by TFA-MOD based on different solutions and the effect of nano-particle dopants on the field properties of YBCO films was investigated by analyzing the results obtained by PPMS according to the Bean Model. The critical current densities (J_c) of YBCO films with YSZ nano-particle were found to be improved with respect to pure YBCO films in range of 0-5 T. The J_c value of YBCO film with YSZ dopant was 0.2 MA/cm² at 50 K and 4 T field, which is 4 times higher than that of pure YBCO film. Furthermore, an optimized property was observed for YBCO films doped by 6 mol.% YSZ nano-particle shown by the dependence relationship between J_c value and field for YBCO films with different amount of YSZ dopants.

Keywords

MOCVD; barium compounds; composite materials; critical current density (superconductivity); doping; flux pinning; high-temperature superconductors; nanoparticles; self-assembly; superconducting epitaxial layers; yttrium compounds; YBa₂Cu₃O_7-x:Y₂O₃Zr₂O₃; bean model; columnar defects; composite films; critical current density; enhanced flux pinning; epitaxial films; metalorganic deposition; nanoparticle dopants; self-assembled yttrium-stabilized zirconia nanoparticles; Artificial pinning center; TFA-MOD; YBCO film; YSZ dopant;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2010.2044780

Filename

5444927