DocumentCode :
1466505
Title :
Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
Author :
Menezes, J.W. ; Barea, L.A.M. ; Chillcce, E.F. ; Frateschi, N. ; Cescato, L.
Author_Institution :
Inst. de Fis. Gleb Wataghin, UNICAMP, Campinas, Brazil
Volume :
4
Issue :
2
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
544
Lastpage :
551
Abstract :
In this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL). The morphology of the samples was analyzed using a scanning electron microscope (SEM), and the plasmonic peaks were measured from the transmission spectrum of the samples. The diameters of the holes recorded by IL present approximately the same statistical deviation as those fabricated by FIB but in a much larger area. Although the transmittance measurements of both types of samples exhibit the characteristic plasmonic peaks, the intrinsic fabrication errors of each technique affect differently the optical spectra.
Keywords :
focused ion beam technology; gold; infrared spectra; metallic thin films; photolithography; plasmonics; scanning electron microscopy; ultraviolet spectra; visible spectra; Au; FIB; SEM; focused ion beam; geometric characteristics; gold films; interference lithography; intrinsic fabrication errors; morphology; optical properties; plasmonic hole arrays; scanning electron microscopy; statistical deviation; transmission spectrum; ultraviolet-visible-infrared optical spectra; Fabrication; Gold; Interference; Ion beams; Plasmons; Resists; Substrates; Lithography; focused ion beam; interference; plasmonics;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2012.2190497
Filename :
6166841
Link To Document :
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