Title :
A point-contact transistor test set
Author_Institution :
General Electric Company, Advanced Electronics Center at Cornell University, Ithaca, N. Y.
Abstract :
The objective in developing this point-contact transistor test set was to measure the important performance characteristics of point-contact transistors intended for use in large-signal applications of the pulse and switching circuit type. Its compact easy-to-use construction utilizes instruments readily available in any laboratory.
Keywords :
Current measurement; Electrical resistance measurement; Instruments; Integrated circuits; Resistance; Switches; Transistors;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1955.6439739
