DocumentCode :
1466649
Title :
Measurements of materials at ultrahigh frequencies
Author :
Schwan, Herman ; Li, Kam
Author_Institution :
Moore School of Electrical Engineering and the Department of Physical Medicine and Rehabilitation, University of Pennsylvania, Philadelphia, Pa.
Volume :
74
Issue :
1
fYear :
1955
Firstpage :
64
Lastpage :
64
Abstract :
THE best ways to measure the dielectric properties of materials with high dielectric constant are described throughout the frequency range from 100 to 1,000 mc. The principles of measurement of dielectric properties at ultrahigh frequencies are well established. They are based on measurement of voltage standing wave ratio and location of standing wave pattern, which results from reflection of electromagnetic energy from the dielectric sample.
Keywords :
Dielectric constant; Dielectric measurements; Frequency measurement; Materials; Power transmission lines; Transmission line measurements;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1955.6439741
Filename :
6439741
Link To Document :
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