• DocumentCode
    1466663
  • Title

    Application of the Spark Plasma Sintering Technique to Low-Temperature Copper Bonding

  • Author

    Mouawad, Bassem ; Soueidan, Maher ; Fabrègue, Damien ; Buttay, Cyril ; Allard, Bruno ; Bley, Vincent ; Morel, Hervé ; Martin, Christian

  • Author_Institution
    Univ. de Lyon, Villeurbanne, France
  • Volume
    2
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    553
  • Lastpage
    560
  • Abstract
    Planar structures, in which a power die is soldered on a substrate and wirebonds are used to connect the top of the die with the substrate, are limited in terms of thermal management and power density. 3-D packaging techniques have been proposed to overcome these limits. Here, an innovative copper-to-copper bonding solution is presented, that can be used for 3-D packaging. The bonding process is described and the effect of the bonding parameters is investigated. It is found that this technique is compatible with the requirements of power electronic packaging. A test assembly including a silicon power die and ceramic substrates is presented.
  • Keywords
    bonding processes; ceramic packaging; semiconductor device packaging; thermal management (packaging); 3-D packaging techniques; bonding process; ceramic substrates; low-temperature copper bonding; planar structures; power density; power electronic packaging; silicon power die; spark plasma sintering technique; thermal management; wirebonds; Assembly; Bonding; Copper; Packaging; Substrates; Temperature; 3-D packaging; power electronics; semiconductor device packaging; spark plasma sintering;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2186453
  • Filename
    6166866