Title :
Functional testing of LSI/VLSI chipsߞA survey
Author :
Lala, P.K. ; Berenjian, N.
Author_Institution :
Syracuse University, Department of Electrical and Computer Engineering, Syracuse, USA
Abstract :
Many approaches have been suggested in recent years for functional testing of LSI/VLSI chips. Most of these techniques are reviewed in this paper and the advantages and disadvantages of each technique are discussed. Finally, some suggestions for future work in functional testing are made.
Keywords :
VLSI; integrated circuit testing; large scale integration; LSI/VLSI chips; functional testing;
Journal_Title :
Electronic and Radio Engineers, Journal of the Institution of
DOI :
10.1049/jiere.1987.0093
