• DocumentCode
    1467000
  • Title

    A study on maximum turn-off current of a high-power GTO

  • Author

    Shimizu, Yoshiteru ; Kimura, Shin ; Kozaka, Hiroshi ; Matsuura, Nobuyoshi ; Tanaka, Tomoyuki ; Monma, Naohiro

  • Author_Institution
    Res. Lab., Hitachi Ltd., Ibaraki, Japan
  • Volume
    46
  • Issue
    2
  • fYear
    1999
  • fDate
    2/1/1999 12:00:00 AM
  • Firstpage
    413
  • Lastpage
    419
  • Abstract
    A 6 kV, 6 kA pnpn-type GTO was fabricated and its maximum turn-off current was investigated. The simulation uses a three-segment device model together with an equivalent circuit model. Results of simulations with segments having different on-state voltages showed current concentration in the lower on-state voltage segment in the fall period. By introducing a homogeneous fabrication process, the on-state voltage distribution band was decreased by a factor of 2. The circuit model simulation results showed the maximum peak current of the improved GTO with smaller on-state voltage band was reduced by a factor of 1.33 compared to that of the conventional GTO. A high-power GTO turn-off limiting model was proposed from the measured 6 kA GTO turn-off locus and the segment SOAs. This turn-off limiting model showed that the GTO would be destroyed when the segment current exceeds the SOA at the time a spike voltage occurs in the fall period. It was demonstrated that the maximum turn-off current estimated by this limiting model coincided well with the experimental results
  • Keywords
    current density; equivalent circuits; semiconductor device models; thyristors; 6 kA; 6 kV; circuit model simulation; current concentration; equivalent circuit model; fall period; high-power GTO; homogeneous fabrication process; maximum turn-off current; on-state voltage distribution band; on-state voltages; pnpn-type GTO; segment current; spike voltage; three-segment device model; turn-off limiting model; Anodes; Associate members; Breakdown voltage; Cathodes; Circuit simulation; Equivalent circuits; Fabrication; Semiconductor optical amplifiers; Snubbers; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.740909
  • Filename
    740909