• DocumentCode
    146731
  • Title

    Ask the Mutants: Mutating Faulty Programs for Fault Localization

  • Author

    Seokhyeon Moon ; Yunho Kim ; Moonzoo Kim ; Shin Yoo

  • Author_Institution
    CS Dept., KAIST, Daejeon, South Korea
  • fYear
    2014
  • fDate
    March 31 2014-April 4 2014
  • Firstpage
    153
  • Lastpage
    162
  • Abstract
    We present MUSE (MUtation-baSEd fault localization technique), a new fault localization technique based on mutation analysis. A key idea of MUSE is to identify a faulty statement by utilizing different characteristics of two groups of mutants-one that mutates a faulty statement and the other that mutates a correct statement. We also propose a new evaluation metric for fault localization techniques based on information theory, called Locality Information Loss (LIL): it can measure the aptitude of a localization technique for automated fault repair systems as well as human debuggers. The empirical evaluation using 14 faulty versions of the five real-world programs shows that MUSE localizes a fault after reviewing 7.4 statements on average, which is about 25 times more precise than the state-of-the-art SBFL technique Op2.
  • Keywords
    program debugging; program testing; software fault tolerance; LIL; MUSE; SBFL technique Op2; automated fault repair system; information theory; locality information loss; mutation analysis; mutation-based fault localization; Educational institutions; Frequency modulation; Information theory; Loss measurement; Maintenance engineering; Testing; fault localization; mutation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation (ICST), 2014 IEEE Seventh International Conference on
  • Conference_Location
    Cleveland, OH
  • Type

    conf

  • DOI
    10.1109/ICST.2014.28
  • Filename
    6823877