• DocumentCode
    146745
  • Title

    Defect detection in pattern texture analysis

  • Author

    Iyer, Manimozhi ; Janakiraman subbaih, S.

  • Author_Institution
    Manonmaniam Sundaranar at Tirunelveli, Tirunelveli, India
  • fYear
    2014
  • fDate
    3-5 April 2014
  • Firstpage
    172
  • Lastpage
    175
  • Abstract
    The detection of abnormalities is a very challenging problem in computer vision, especially if these abnormalities must be detected in images of textured surfaces. The cast extrusion manufacturing process is the initial step which enables the creation of the raw materials, such as clear polypropylene film, needed for the flexible packaging manufacturing process. The current methodology of controlling extrusion related defects occurrences is attempted by a combination of statistical Sampling and human inspection. However, the defects are small in size and hard to visualize in a clear thin film 3 m in width moving at a speed of 50m/min/.This resulted in poor product quality and high return ratio from customers. This problem becomes even more complicated in case when testing is possible only with one surface of the part. Texture analysis plays an important role in the automated visual inspection of texture images to detect their defects. This automated classification method helps us to acquire knowledge about the pattern of defect within a very short period of time. This research investigates possible defect detection methodologies and has subsequently proposed a system that is capable of real time monitoring of defects on the cast extrusion manufacturing process.
  • Keywords
    computer vision; extrusion; feature extraction; image classification; image texture; inspection; production engineering computing; sampling methods; automated classification method; automated visual inspection; cast extrusion manufacturing process; computer vision; defect detection; human inspection; pattern texture analysis; statistical sampling; textured surface image; Image edge detection; Monitoring; Performance evaluation; Random access memory; Defect detection; Image processing and pattern Texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Signal Processing (ICCSP), 2014 International Conference on
  • Conference_Location
    Melmaruvathur
  • Print_ISBN
    978-1-4799-3357-0
  • Type

    conf

  • DOI
    10.1109/ICCSP.2014.6949822
  • Filename
    6949822